Identification of Linear Systems in the Presence of Nonlinear Distortions

Rik Pintelon; Joannes Schoukens

Identification of Linear Systems in the Presence of Nonlinear Distortions

Onderzoeksoutput: Conference paper

3 Citaten (Scopus)

Originele taal-2	English
Titel	IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884
Status	Published - 2000
Evenement	Unknown - Duur: 1 jan. 2000 → …

Conference

Conference	Unknown
Periode	1/01/00 → …

Bibliografische nota

IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884

Handle.net

Permanente koppeling

Citeer dit

@inproceedings{e20dca189064460b958d6345dff07a34,

title = "Identification of Linear Systems in the Presence of Nonlinear Distortions",

author = "Rik Pintelon and Joannes Schoukens",

note = "IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884; Unknown ; Conference date: 01-01-2000",

year = "2000",

language = "English",

booktitle = "IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884",

}

TY - GEN

T1 - Identification of Linear Systems in the Presence of Nonlinear Distortions

AU - Pintelon, Rik

AU - Schoukens, Joannes

N1 - IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884

PY - 2000

Y1 - 2000

M3 - Conference paper

BT - IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884

T2 - Unknown

Y2 - 1 January 2000

ER -