Projecten per jaar
Samenvatting
We investigate the effect of varying the gate-to-drain spacing and the gate field-plate on the device linearity of GaN HEMTs on Si for 0.11μm, 0.15μm, and 0.19μm gate lengths. The gain compression, phase distortion, and harmonic distortion metrics are measured using a nonlinear characterisation setup calibrated at 6GHz up to the third harmonic. The acquired nonlinearity metrics are correlated with the extrinsic device parasitics extracted from S-parameter measurements. We observe that excessive gate field-plate length scaling down to 0.05μm lowers the total phase distortion at the expense of gain linearity and harmonic distortion in Class AB while minimising the gate-to-drain spacing alleviates the harmonic distortion only for devices of 0.19μm gate length. Further evaluation, under matched conditions, using a passive load-pull measurement setup points to a decline in the peak achievable PAE and PSAT at gate field-plates smaller than 0.12μm.
Originele taal-2 | English |
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Titel | 2021 16th European Microwave Integrated Circuits Conference (EuMIC) |
Uitgeverij | IEEE |
Pagina's | 30-33 |
Aantal pagina's | 4 |
ISBN van elektronische versie | 978-2-87487-064-4 |
ISBN van geprinte versie | 978-1-6654-4722-5 |
DOI's | |
Status | Published - 3 apr. 2022 |
Evenement | European Microwave Week: United in Microwaves - ExCEL London, London, United Kingdom Duur: 2 apr. 2022 → 7 apr. 2022 Congresnummer: 51 https://www.eumw2021.com/ |
Publicatie series
Naam | EuMIC 2021 - 2021 16th European Microwave Integrated Circuits Conference |
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Conference
Conference | European Microwave Week |
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Verkorte titel | EuMW |
Land/Regio | United Kingdom |
Stad | London |
Periode | 2/04/22 → 7/04/22 |
Internet adres |
Vingerafdruk
Duik in de onderzoeksthema's van 'Linearity Assessment of GaN HEMTs on Si using Nonlinear Characterisation'. Samen vormen ze een unieke vingerafdruk.Projecten
- 1 Afgelopen
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SRP19: Centrum voor modelgebaseerde systeemverbetering - van computer-gerichte engineering tot model-gerichte engineering
Vandersteen, G., Rolain, Y., Wambacq, P., Kuijk, M., Vandersteen, G., Rolain, Y., Wambacq, P. & Kuijk, M.
1/11/12 → 31/10/24
Project: Fundamenteel