Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

Stephane Bronckers, Gerd Vandersteen, Charlotte Soens, G. Van Der Plas, Yves Rolain

Onderzoeksoutput: Conference paperResearch

3 Citaten (Scopus)

Samenvatting

On-chip oscillators are very sensitive to substrate perturbations.
Both low-frequency and high-frequency distortions can ruin
the required spectral purity of the oscillator. This paper presents the
measurement and modeling results of the sensitivity of a 900MHz LCVoltage
Controlled Oscillator (LC-VCO) to substrate perturbations
in a frequency range from DC to 900MHz. Accurate measurement of
the sensitivity require various measurement setups to investigate different
impact fenomena. These measurements implies spectral analysis,
linear vectorial network analyzer measurements and time domain
measurements. The impact of substrate noise is modeled in a high
Ohmic 0.18um 1P6M CMOS technology. Below 10MHz, the impact
is dominated by the on-chip resistance of the VCO ground. Above
10MHz, the bond wires, parasitics of the on-chip inductor and the
off-chip decoupling capacitors determine the sensitivity to substrate
perturbations.
Originele taal-2English
TitelIMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
StatusPublished - 1 mei 2007
EvenementUnknown - Stockholm, Sweden
Duur: 21 sep 200925 sep 2009

Conference

ConferenceUnknown
Land/RegioSweden
StadStockholm
Periode21/09/0925/09/09

Vingerafdruk

Duik in de onderzoeksthema's van 'Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations'. Samen vormen ze een unieke vingerafdruk.

Citeer dit