Noise characterization for historical documents with physical distortions

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3 Citaten (Scopus)

Samenvatting

Physical distortions (such as thorn-offs and scratches) are commonly seen in historical documents. Their presence disturbs downstream processes such as optical character recognition (OCR) and layout analysis, which leads to reduced productivity in automatic document information retrieval. A proper characterization of such physical noise is an important step in the development of historical document denoising methods. In this paper, we tackle noise characterization with Bayesian labeling, where noise and text pixels are characterized in terms of likelihood densities. We employ in particular two different significance measures, which are formulated using pointwise and cone-of-influence (COI) approximation of local Lipschitz regularity in the wavelet domain. We evaluate the effectiveness of the proposed noise characterization using a binary noise versus text classification model, where we show that a naive binary classifier using average point ratio (APR) or average cone ratio (ACR) distribution densities leads to effective classification of noise and text pixels with encouraging overall success rates. This encourages future work on the development of Bayesian frameworks for the recognition of physical distortions in historical documents.
Originele taal-2English
TitelProceedings Volume 11353, Optics, Photonics and Digital Technologies for Imaging Applications VI
RedacteurenPeter Schelkens, Tomasz Kozacki
Plaats van productieFrance
UitgeverijSPIE
Pagina's1-11
Aantal pagina's11
Volume11353
UitgaveVI, 113530F
ISBN van elektronische versie9781510634787
DOI's
StatusPublished - 1 apr 2020
Evenement SPIE Photonics Europe, 2020 - online, Strasbourg, France
Duur: 6 apr 202010 apr 2020
https://spie.org/conferences-and-exhibitions/photonics-europe?utm_id=repe20pae&spMailingID=4563957&spUserID=MjA2NDExNDgyMTA3S0&spJobID=920584314&spReportId=OTIwNTg0MzE0S0&SSO=1

Publicatie series

NaamOptics, Photonics and Digital Technologies for Imaging Applications VI
UitgeverijSPIE
Nummer11353-14
Volume11353

Conference

Conference SPIE Photonics Europe, 2020
Land/RegioFrance
StadStrasbourg
Periode6/04/2010/04/20
Internet adres

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