Non-Invasive Dual-Probe Time Domain Measurements of Incident and Reflected Waves on High-Speed Digital Chip Interconnects

Onderzoeksoutput: Conference paper

Originele taal-2English
Titel49th ARFTG Conference, IEEE-MTT-S Int. Microwave Symposium, Denver, Colorado, June 1997, pp. 201–207
Uitgeverij49th ARFTG Conference, IEEE-MTT-S Int. Microwave Symposium, Denver, Colorado, June 1997, pp. 201–207
StatusPublished - 1 jun 1997

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49th ARFTG Conference, IEEE-MTT-S Int. Microwave Symposium, Denver, Colorado, June 1997, pp. 201–207

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