Performance degradation of RF circuits due to impact of digital switching noise

Charlotte Soens, G. Van Der Plas, P. Wambacq, S. Donnay, Maarten Kuijk, Alain Barel

Onderzoeksoutput: Articlepeer review

Samenvatting

The past years the market of wireless applications has grown enourmously, driven by the development of high performance, low cost CMOS technologies. This CM”OS evolution allows the integration of an increasing amount of digital and analog functions on a single die, enabling cost and power reduction. In many cases the coupling of digital switching noise via the common die to the analog circuits degrades the overall system performance, sometimes resulting in device failure. An overview of substrate noise coupling issues can be found in [1]. The goal of this Ph.D. research is to fully uncerstand the mechanisms behind the performance degradation of RF circuits due to impact of digital switching noise in order to control and solve the problem.
Originele taal-2English
Pagina's (van-tot)1472-1481
Aantal pagina's9
TijdschriftIEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume40
Nummer van het tijdschrift7
DOI's
StatusPublished - 1 jan 2005

Bibliografische nota

Belgian Journal of Electronics & Communications HF, No. 1, 2005, pp. 17-18

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