Quantitative WD-XRF calibration for small ceramic samples and their source material

A wavelength-dispersive X-ray fluorescence (WD-XRF) calibration is developed for small powdered samples (300mg) with the purpose of analyzing ceramic artifacts that might be available only in limited quantity. This is compared to a conventional calibration using a larger sample mass (2g). The comparison of elemental intensities obtained in both calibrations shows that the decrease in analyzed sample mass results in a linear decrease in measured intensity for the analyzed elements. This indicates that the small- and large-sample calibrations are comparable. Moreover, the elemental contents of four ceramic sherds and two potential clay sources fall well within the range of the certified reference materials that are the basis of the calibration curves. The advantage with the analytical method presented here is that it is rapid and requires only a small amount of sample that can easily be re-used for further analyses. This method has great potential in ceramic provenance studies.