Split-band interferometric SAR processing using TanDEM-X data

De Rauw Dominique, Kervyn François, D'Oreye Nicolas, Smets Benoit, Albino Fabien, Barbier Christian

Onderzoeksoutput: Conference paperResearch

Samenvatting

Most recent SAR sensors use wide band signals to achieve metric range resolution. One can also take advantage of wide band to split it into sub-bands and generate several lower-resolution images, centered on slightly different frequencies, from a single acquisition. This process, named Multi Chromatic Analysis (MCA) corresponds to performing a spectral analysis of SAR images. Split-Band SAR interferometry (SBInSAR) is based on spectral analysis performed on each image of an InSAR pair, yielding a stack of sub-band interferograms. Scatterers keeping a coherent behaviour in each subband interferogram show a phase that varies linearly with the carrier frequency, the slope being proportional to the absolute optical path difference. This potentially solves the problems of phase unwrapping on a pixelperpixel basis. In this paper, we present an SBInSAR processor and its application using TanDEM-X data over the Nyiragongo volcano.

Originele taal-2English
TitelProceedings of FRINGE 2015
SubtitelAdvances in the Science and Applications of SAR Interferometry and Sentinel-1 InSAR Workshop
RedacteurenL. Ouwehand
UitgeverijEuropean Space Agency
Aantal pagina's7
ISBN van elektronische versie9789292212957
StatusPublished - 1 mei 2015
EvenementFringe 2015 Workshop - Frascati, Italy
Duur: 23 mrt 201527 mrt 2015

Publicatie series

NaamEuropean Space Agency, (Special Publication) ESA SP
VolumeSP-731
ISSN van geprinte versie0379-6566

Conference

ConferenceFringe 2015 Workshop
Land/RegioItaly
StadFrascati
Periode23/03/1527/03/15

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