The use of spetroscopic ellipsometry for the characterisation of conversion coatings on aluminium

Tom SCHRAM, Priya Laha

Onderzoeksoutput: Editorial

Originele taal-2English
TijdschriftUnknown Journal
StatusPublished - 2000

Bibliografische nota

Extended Abstracts 2nd International Symposium on Aluminium Surface Science and Technology, 21-25.05.2000, Manchester, England, 129

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