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A novel method is presented for the determination of the thickness of a polymer layer on a solid substrate by through-thickness local
thermal analysis (LTA) measurements using a micro-thermal analyser (mTA). The feasibility of the method is illustrated for a poly(methyl
methacrylate) film spin-cast on a silicon wafer. Subsequently the method is applied to determine the skin layer thickness of multi-layered biaxially-oriented polypropylene (BOPP) films. Although the melting temperatures of skin and core layer are only 15 8C different, it proved
to be possible to determine the skin layer thickness. The film thickness obtained by mTA correlates well with the thickness observed by
transmission electron microscopy (TEM) in a 0.1–1.6 mm range. The method is shown to be accurate, robust, and fast.
thermal analysis (LTA) measurements using a micro-thermal analyser (mTA). The feasibility of the method is illustrated for a poly(methyl
methacrylate) film spin-cast on a silicon wafer. Subsequently the method is applied to determine the skin layer thickness of multi-layered biaxially-oriented polypropylene (BOPP) films. Although the melting temperatures of skin and core layer are only 15 8C different, it proved
to be possible to determine the skin layer thickness. The film thickness obtained by mTA correlates well with the thickness observed by
transmission electron microscopy (TEM) in a 0.1–1.6 mm range. The method is shown to be accurate, robust, and fast.
Originele taal-2 | English |
---|---|
Pagina's (van-tot) | 7132-7139 |
Aantal pagina's | 8 |
Tijdschrift | Polymer |
Volume | 46 |
Status | Published - 2005 |
Bibliografische nota
Polymer 46(18) (2005) 7132-7139.Vingerafdruk
Duik in de onderzoeksthema's van 'Through-thickness analysis of the skin layer thickness of multi-layered biaxially-oriented polypropylene films by micro-thermal analysis'. Samen vormen ze een unieke vingerafdruk.Projecten
- 2 Afgelopen
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Micro- and Nanothermal analysis on Biaxially Oriented Polypropylene films
Guy Van Assche (Member)
2002 → 2008Activiteit: Consultancy
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Solvay SA, Central Management Research & Technology (Externe Organisatie)
Guy Van Assche (Member)
1 okt 2002 → …Activiteit: Membership of external research organisation