Through-thickness analysis of the skin layer thickness of multi-layered biaxially-oriented polypropylene films by micro-thermal analysis

Guy Van Assche, Antoine Ghanem, Olivier Lhost, Bruno Van Mele

    Onderzoeksoutput: Articlepeer review

    9 Citaten (Scopus)

    Samenvatting

    A novel method is presented for the determination of the thickness of a polymer layer on a solid substrate by through-thickness local
    thermal analysis (LTA) measurements using a micro-thermal analyser (mTA). The feasibility of the method is illustrated for a poly(methyl
    methacrylate) film spin-cast on a silicon wafer. Subsequently the method is applied to determine the skin layer thickness of multi-layered biaxially-oriented polypropylene (BOPP) films. Although the melting temperatures of skin and core layer are only 15 8C different, it proved
    to be possible to determine the skin layer thickness. The film thickness obtained by mTA correlates well with the thickness observed by
    transmission electron microscopy (TEM) in a 0.1–1.6 mm range. The method is shown to be accurate, robust, and fast.
    Originele taal-2English
    Pagina's (van-tot)7132-7139
    Aantal pagina's8
    TijdschriftPolymer
    Volume46
    StatusPublished - 2005

    Bibliografische nota

    Polymer 46(18) (2005) 7132-7139.

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