Samenvatting
This work presents a data analysis extension to a well-established methodology for the assessment of organic coatings using imaging time-of-flight secondary ion mass spectrometry (ToF-SIMS). Such an approach produced results that can be analyzed using a multivariate analysis (MVA) procedure that performs the simultaneous processing of spatially and chemically related datasets.
Originele taal-2 | English |
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Toekennende instantie |
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Begeleider(s)/adviseur |
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Datum van toekenning | 31 jan 2020 |
Plaats van publicatie | Brussels |
Status | Published - 2020 |